Measurement Forum at electronica 2026 Testing for AI Infrastructure and Power Electronics

Von Dipl.-Ing. (FH) Hendrik Härter 2 min Lesedauer

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From AI-assisted measurement workflows to high-current inductor testing, the Measurement Forum will explore how engineers can validate increasingly complex electronic systems. The programme takes place on 12 November at the electronica Stage in Hall A5.

The Measurement Forum at electronica 2026 will take place on November 12 in Hall A5.(Bild:  Messe München GmbH Photo: Frommel fotodesign)
The Measurement Forum at electronica 2026 will take place on November 12 in Hall A5.
(Bild: Messe München GmbH Photo: Frommel fotodesign)

The Measurement Forum brings together 13 half-hour presentations on measurement, test and validation for hardware and embedded engineers. Topics range from AI in engineering and test workflows to current sensing, power electronics, imaging and electronics manufacturing.

Several talks focus on the infrastructure behind AI computing. Keysight will examine how measurement and validation approaches are changing as compute, memory, networking and photonics evolve. Tektronix will address testing power infrastructure for hyperscale data centres, while ET System electronic will present test challenges for AI data-centre power systems.

Other sessions look at practical measurement problems in power electronics and sensing. Infineon will discuss high-bandwidth current sensing; Xiamen ZTC Technology will cover zero-phase current transformers for residual-current detection; and Microtest will address measuring inductor saturation and temperature-rise current under high DC bias. The programme also includes talks on image sensors and SPAD technology, RF-over-Fiber signal integrity, SiC and GaN testing, and standardised test procedures for electronics manufacturing.

12 November 2026 | 10:30–17:00 | electronica Stage, Hall A5

Time Company Presentation Speaker
10:30–11:00 Keysight AI is redefining infrastructure. Can measurement keep up? Yash Kulkarni
11:00–11:30 Liquid Instruments Deterministic Hardware with Stochastic Authors: Where AI Belongs in Your Test Workflow Rory Smith
11:30–12:00 Infineon High-bandwidth current sensing solutions in advanced power electronics Srivats Rajasekaran
12:00–12:30 Xiamen ZTC Technology Balancing Characteristics of Zero-Phase Current Transformers for Reliable Residual Current Detection Jacob Su
12:30–13:00 Hamamatsu Photonics Deutschland From Pixels to Industrial Productivity: Advanced Image Sensors and SPAD Dr. Ljiljana Durdevic
13:00–13:30 ET System electronic AIDC Testing Challenges and NGI Full-Scenario Test Solutions Pan Liang
13:30–14:00 Microtest Testing Inductors for the AI Era: A Practical Guide to Measuring Saturation and Temperature-Rise Current under High DC Bias Peter Hsieh
14:00–14:30 Tektronix When Measurement Meets AI: Testing and Validating the Power Infrastructure of Hyperscale Data Centers Michael Himmels
14:30–15:00 Rohde & Schwarz Streamlining Site Troubleshooting with a new Handheld Spectrum, CAT, and VNA Analyzer Martin Schmähling
15:00–15:30 Teledyne LeCroy AI meets XDEV – Building Intelligent Test & Measurement Applications Sven Kaiser
15:30–16:00 Siglent RF-over-Fiber Signal Integrity: From Challenge to Measurement Dr. Bharat Grover
16:00–16:30 MCD Elektronik MCD TestMate – Standardized Test Procedures for Greater Process Reliability in Electronics Manufacturing Yannick Rauscher
16:30–17:00 VX Instruments Optimizing Test Speed to reduce Test Costs for SiC/GaN Power Devices Alexander Loibl

Important to Know

When: 12 November 2026, 10:30–17:00

Where: electronica Stage, Hall A5

For more information, please visit the Measurement Technology Forum in Munich.(heh)

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